[Under Review]: Sync test report post #10

jnunyez · 2023-11-20T18:30:43Z

First version of test report blog post

nocturnalastro · 2023-11-28T17:05:33Z

sync_test_suite/README.md

+
+The τ observation interval is a time interval that is generally fixed before the start of a measurement test. The TE is measured and recorded at the beginning of the test and after each observation interval time has passed; and the difference between the corresponding time error values gives the TIE for that observation interval.
+
+TIE measures the total error that a clock has accumulated as compared to a reference clock since the beginning of the test. Also, because TIE is calculated from TE, TIE is also measured using units of seconds. For any measurement, by convention the value of TIE is defined to be zero at the start of the measurement. If you observe a MTIE of zeros means that the TIE has not changed at all during the observation interval τ.


Remove For any measurement from in front of
by convention the value of TIE is defined to be zero at the start of the measurement.

crwr45

First pass; here's some suggestions

crwr45 · 2023-11-28T16:41:05Z

sync_test_suite/README.md

@@ -0,0 +1,206 @@
+# A guide to understand Telecom GrandMaster on OpenShift Test Reports
+
+Are you trying to understand the results obtained by your [Telecom GrandMaster (T-GM) test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf)? Analysing test reports is another activity of the test process and in this case usually requires of specific expertise. This guide is intended for users faced with understanding and intepreting the results showed by the results in a [T-GM test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf). In what follows, we will provide a comprehensive guide to help understand and interpret the T-GM test report results for a non synchronization expert user. 


I'd avoid the term "faced with". "Faced with" implies a bad thing.

Suggested change

Are you trying to understand the results obtained by your [Telecom GrandMaster (T-GM) test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf)? Analysing test reports is another activity of the test process and in this case usually requires of specific expertise. This guide is intended for users faced with understanding and intepreting the results showed by the results in a [T-GM test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf). In what follows, we will provide a comprehensive guide to help understand and interpret the T-GM test report results for a non synchronization expert user.

Are you trying to understand the results obtained by your [Telecom GrandMaster (T-GM) test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf)? Analysing test reports is another activity of the test process and in this case usually requires specific expertise. This guide helps with understanding and intepreting the results showed by the results in a [T-GM test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf). In what follows, we will provide a comprehensive guide to help understand and interpret the T-GM test report results for a non synchronization expert user.

crwr45 · 2023-11-28T16:48:31Z

sync_test_suite/README.md

@@ -0,0 +1,206 @@
+# A guide to understand Telecom GrandMaster on OpenShift Test Reports
+
+Are you trying to understand the results obtained by your [Telecom GrandMaster (T-GM) test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf)? Analysing test reports is another activity of the test process and in this case usually requires of specific expertise. This guide is intended for users faced with understanding and intepreting the results showed by the results in a [T-GM test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf). In what follows, we will provide a comprehensive guide to help understand and interpret the T-GM test report results for a non synchronization expert user. 


I think it would be good to include a sentence in the intro on why they should be looking at the report and not just the pass/fail.

crwr45 · 2023-11-28T16:51:38Z

sync_test_suite/README.md

+
+## Independent Validation Environment <a name="validation"></a>
+
+The first category of tests that you can find in the T-GM test report aim at providing the validation of the environment where the T-GM performance tests need to be executed. The results can confirm or rule out the environment where you plan to run to evaluate the T-GM performance characaterization. In other words, the results of the validation environment section in the [T-GM test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf) will tell you whether it is worth or not to take a look at the performance T-GM tests that follow in the test report.


They also serve as an environment software and hardware audit.

crwr45 · 2023-11-28T17:01:19Z

sync_test_suite/README.md

+
+- The measured TE can be negative or positive. A negative Time Error (TE) occurs when the measured clock signal under test arrives later than the reference clock signal. A positive Time Error (TE) occurs when the measured clock signal under test leads the reference clock signal.
+
+- A very relevant value is the maximum absolute Time Error, which can be denoted as max|TE|. The max|TE| is a single value, representing the TE value that lies further away from the reference clock. In this case max|TE| reaches more than 1 second, which is clearly outside the limits allowed by PRTC-A and PRTC-B classes.


Suggested change

- A very relevant value is the maximum absolute Time Error, which can be denoted as max|TE|. The max|TE| is a single value, representing the TE value that lies further away from the reference clock. In this case max|TE| reaches more than 1 second, which is clearly outside the limits allowed by PRTC-A and PRTC-B classes.

- A very relevant value is the maximum absolute Time Error, which can be denoted as max|TE|. The max|TE| is a single value, representing the TE value that lies furthest away from the reference clock. In this case max|TE| reaches more than 1 second, which is clearly outside the limits allowed by PRTC-A and PRTC-B classes.

crwr45 · 2023-11-28T17:03:34Z

..._test_suite/images/sync_G.8272_time-error-in-locked-mode_DPLL-to-PHC_PRTC-A_testimpl_bad.png

We should really add units to the axes.

Agree. See PRs below:

@nocturnalastro redhat-partner-solutions/vse-sync-pp#51

@crwr45 redhat-partner-solutions/vse-sync-test#78

crwr45 · 2023-11-28T17:07:37Z

sync_test_suite/README.md

+
+- The measured MTIE can be only positive. Note that the minimum test window period for TDEV is twelve times the maximum observation interval in accordance with ITU-T recommendation [G.811](https://www.itu.int/rec/T-REC-G.811-199709-I/en[G.811]).
+
+So are the reported MTIE values in the Figure above bad or good? It always depends on the MTIE masks (or MTIE limits)! In our case the maximum observed MTIE ocurring at low observation intervals is 1ns which is quite below the MTIE limits during the whole observation intervals, which well above 10ns. This reveals that the reported MTIE measurements showed in the Figure above (for the observed window interval) is able to comply with both PRTC-A and PRTC-B requirements.


Suggested change

So are the reported MTIE values in the Figure above bad or good? It always depends on the MTIE masks (or MTIE limits)! In our case the maximum observed MTIE ocurring at low observation intervals is 1ns which is quite below the MTIE limits during the whole observation intervals, which well above 10ns. This reveals that the reported MTIE measurements showed in the Figure above (for the observed window interval) is able to comply with both PRTC-A and PRTC-B requirements.

So are the reported MTIE values in the Figure above bad or good? It always depends on the MTIE masks (or MTIE limits)! In our case the maximum observed MTIE ocurring at low observation intervals is 1ns which is well below the MTIE limits during the whole observation intervals of above 10ns. This reveals that the reported MTIE measurements showed in the Figure above (for the observed window interval) is able to comply with both PRTC-A and PRTC-B requirements.

jnunyez force-pushed the sync_test_report branch 17 times, most recently from 0c771a6 to 2169b5f Compare November 28, 2023 16:22

nocturnalastro reviewed Nov 28, 2023

View reviewed changes

crwr45 reviewed Nov 28, 2023

View reviewed changes

jnunyez force-pushed the sync_test_report branch 2 times, most recently from 28581d5 to 9c67f24 Compare November 28, 2023 21:31

jnunyez changed the title ~~Sync test report~~ [Under Review]: Sync test report post Nov 29, 2023

jnunyez force-pushed the sync_test_report branch 8 times, most recently from 8073158 to 2e2f2aa Compare November 29, 2023 17:59

initial post draft

2bf6a06

jnunyez force-pushed the sync_test_report branch from 2e2f2aa to 2bf6a06 Compare November 29, 2023 18:47

jnunyez merged commit f4c669f into main Dec 1, 2023

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[Under Review]: Sync test report post #10

[Under Review]: Sync test report post #10

jnunyez commented Nov 20, 2023

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		The τ observation interval is a time interval that is generally fixed before the start of a measurement test. The TE is measured and recorded at the beginning of the test and after each observation interval time has passed; and the difference between the corresponding time error values gives the TIE for that observation interval.

		TIE measures the total error that a clock has accumulated as compared to a reference clock since the beginning of the test. Also, because TIE is calculated from TE, TIE is also measured using units of seconds. For any measurement, by convention the value of TIE is defined to be zero at the start of the measurement. If you observe a MTIE of zeros means that the TIE has not changed at all during the observation interval τ.

		@@ -0,0 +1,206 @@
		# A guide to understand Telecom GrandMaster on OpenShift Test Reports

		Are you trying to understand the results obtained by your [Telecom GrandMaster (T-GM) test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf)? Analysing test reports is another activity of the test process and in this case usually requires of specific expertise. This guide is intended for users faced with understanding and intepreting the results showed by the results in a [T-GM test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf). In what follows, we will provide a comprehensive guide to help understand and interpret the T-GM test report results for a non synchronization expert user.


		## Independent Validation Environment <a name="validation"></a>

		The first category of tests that you can find in the T-GM test report aim at providing the validation of the environment where the T-GM performance tests need to be executed. The results can confirm or rule out the environment where you plan to run to evaluate the T-GM performance characaterization. In other words, the results of the validation environment section in the [T-GM test report](addmat/test_report_fiesta_20231103T110635Z_84adb821.pdf) will tell you whether it is worth or not to take a look at the performance T-GM tests that follow in the test report.


		- The measured TE can be negative or positive. A negative Time Error (TE) occurs when the measured clock signal under test arrives later than the reference clock signal. A positive Time Error (TE) occurs when the measured clock signal under test leads the reference clock signal.

		- A very relevant value is the maximum absolute Time Error, which can be denoted as max\|TE\|. The max\|TE\| is a single value, representing the TE value that lies further away from the reference clock. In this case max\|TE\| reaches more than 1 second, which is clearly outside the limits allowed by PRTC-A and PRTC-B classes.


		- The measured MTIE can be only positive. Note that the minimum test window period for TDEV is twelve times the maximum observation interval in accordance with ITU-T recommendation [G.811](https://www.itu.int/rec/T-REC-G.811-199709-I/en[G.811]).

		So are the reported MTIE values in the Figure above bad or good? It always depends on the MTIE masks (or MTIE limits)! In our case the maximum observed MTIE ocurring at low observation intervals is 1ns which is quite below the MTIE limits during the whole observation intervals, which well above 10ns. This reveals that the reported MTIE measurements showed in the Figure above (for the observed window interval) is able to comply with both PRTC-A and PRTC-B requirements.

[Under Review]: Sync test report post #10

[Under Review]: Sync test report post #10

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