[sival/flash_ctrl] Modify flash_ctrl test for checking flash read/write

sw/device/lib/testing/flash_ctrl_testutils.c

@@ -392,3 +392,19 @@ void flash_ctrl_testutils_info_region_print(
            mubi_prop(p->ecc_en, "EC"), mubi_prop(p->high_endurance_en, "HE"),
            locked ? "LK" : "UN");
 }
+
+status_t flash_ctrl_testutils_find_unlocked_region(
+    dif_flash_ctrl_state_t *flash, uint32_t start, uint32_t end,
+    uint32_t *region) {
+  for (uint32_t data_region = start; data_region <= end; data_region++) {
+    bool locked;
+    CHECK_DIF_OK(
+        dif_flash_ctrl_data_region_is_locked(flash, data_region, &locked));
+    if (!locked) {
+      LOG_INFO("Region %u is unlocked", data_region);
+      *region = data_region;
+      return OK_STATUS();
+    }
+  }
+  return INTERNAL();
+}

sw/device/lib/testing/flash_ctrl_testutils.h

@@ -314,4 +314,18 @@ void flash_ctrl_testutils_data_region_print(
 void flash_ctrl_testutils_info_region_print(
     dif_flash_ctrl_info_region_t region, dif_flash_ctrl_region_properties_t *p,
     bool locked);
+
+/**
+ * Check for unlocked flash data regions
+ *
+ * This prints the unlocked region that is found
+ *
+ * @param flash A flash_ctrl state handle.
+ * @param start Start of the region range to search
+ * @param end End of the region range to search
+ * @param region The data protection region
+ */
+status_t flash_ctrl_testutils_find_unlocked_region(
+    dif_flash_ctrl_state_t *flash, uint32_t start, uint32_t end,
+    uint32_t *region);
 #endif  // OPENTITAN_SW_DEVICE_LIB_TESTING_FLASH_CTRL_TESTUTILS_H_

sw/device/tests/flash_ctrl_idle_low_power_test.c

@@ -18,11 +18,11 @@
 #include "sw/device/lib/testing/test_framework/check.h"
 #include "sw/device/lib/testing/test_framework/ottf_main.h"
 
+#include "flash_ctrl_regs.h"
 #include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
 #include "sw/device/lib/testing/autogen/isr_testutils.h"
 
 OTTF_DEFINE_TEST_CONFIG();
-
 static dif_rv_plic_t plic;
 static dif_aon_timer_t aon;
 static dif_rv_core_ibex_t rv_core_ibex;
@@ -43,7 +43,7 @@ static top_earlgrey_plic_peripheral_t peripheral_serviced;
 static dif_aon_timer_irq_t irq_serviced;
 
 enum {
-  kFlashDataRegion = 2,  // The ROM_EXT protects itself using regions 0-1.
+  kDataRegions = FLASH_CTRL_PARAM_NUM_REGIONS,
   kRegionBasePageIndex =
       256 + 32,  // First non-ROM_EXT page in bank 1 (avoids program code.)
   kPartitionId = 0,
@@ -102,6 +102,8 @@ bool test_main(void) {
   dif_pwrmgr_t pwrmgr;
   dif_rstmgr_t rstmgr;
 
+  uint32_t flash_region_index;
+
   CHECK_DIF_OK(dif_rv_plic_init(
       mmio_region_from_addr(TOP_EARLGREY_RV_PLIC_BASE_ADDR), &plic));
   CHECK_DIF_OK(dif_flash_ctrl_init_state(
@@ -126,8 +128,13 @@ bool test_main(void) {
   rstmgr_reset_info = rstmgr_testutils_reason_get();
 
   uint32_t address = 0;
+  // Find the first unlocked flash region and use that for testing
+
+  CHECK_STATUS_OK(flash_ctrl_testutils_find_unlocked_region(
+      &flash, 0, kDataRegions - 1, &flash_region_index));
+
   CHECK_STATUS_OK(flash_ctrl_testutils_data_region_setup(
-      &flash, kRegionBasePageIndex, kFlashDataRegion, kRegionSize, &address));
+      &flash, kRegionBasePageIndex, flash_region_index, kRegionSize, &address));
 
   if (rstmgr_reset_info == kDifRstmgrResetInfoPor) {
     // Create data. Random data will be different than

sw/device/tests/flash_ctrl_ops_test.c

@@ -14,6 +14,7 @@
 #include "sw/device/lib/testing/test_framework/check.h"
 #include "sw/device/lib/testing/test_framework/ottf_main.h"
 
+#include "flash_ctrl_regs.h"
 #include "hw/top_earlgrey/sw/autogen/top_earlgrey.h"
 #include "otp_ctrl_regs.h"
 #include "sw/device/lib/testing/autogen/isr_testutils.h"
@@ -68,6 +69,7 @@ enum {
   kInfoSize = 16,
   kDataSize = 32,
   kPageSize = 2048,
+  kDataRegions = FLASH_CTRL_PARAM_NUM_REGIONS
 };
 
 const uint32_t kRandomData1[kInfoSize] = {
@@ -266,6 +268,8 @@ static void do_bank0_data_partition_test(void) {
       .prog_en = kMultiBitBool4True,
       .rd_en = kMultiBitBool4True};
 
+  CHECK_STATUS_OK(flash_ctrl_testutils_find_unlocked_region(
+      &flash_state, 0, kDataRegions - 1, &flash_bank_0_data_region));
   CHECK_STATUS_OK(flash_ctrl_testutils_data_region_setup_properties(
       &flash_state, kRegionBaseBank0Page0Index, flash_bank_0_data_region,
       kRegionSize, region_properties, &address));
@@ -309,13 +313,19 @@ static void do_bank1_data_partition_test(void) {
     uint32_t page_index =
         (i == 0) ? flash_bank_1_page_index : flash_bank_1_page_index_scr;
     const uint32_t *test_data = (i == 0) ? kRandomData4 : kRandomData5;
+    CHECK_STATUS_OK(flash_ctrl_testutils_find_unlocked_region(
+        &flash_state, 0, kDataRegions - 1, &flash_bank_1_data_region));
 
     if (i == 0) {
       // Set region1 for non-scrambled ecc enabled.
       CHECK_STATUS_OK(flash_ctrl_testutils_data_region_setup(
           &flash_state, page_index, flash_bank_1_data_region, kRegionSize,
           &address));
     } else {
+      CHECK_STATUS_OK(flash_ctrl_testutils_find_unlocked_region(
+          &flash_state, flash_bank_1_data_region + 1, kDataRegions - 1,
+          &flash_bank_1_data_region_scr));
+
       // Set region2 for scrambled ecc enabled.
       CHECK_STATUS_OK(flash_ctrl_testutils_data_region_scrambled_setup(
           &flash_state, page_index, flash_bank_1_data_region_scr, kRegionSize,
@@ -423,22 +433,9 @@ static void do_bank1_data_partition_test(void) {
 bool test_main(void) {
   flash_info = dif_flash_ctrl_get_device_info();
 
-  // Determine the region index and page index to use for tests.
-  // Test data page used for flash bank 1 should be the lowest and highest
-  // usable page.
-  if (kBootStage != kBootStageOwner) {
-    flash_bank_0_data_region = 0;
-    flash_bank_1_page_index = flash_info.data_pages;
-  } else {
-    // If we boot up in owner stage, the first 2 regions will be used by
-    // ROM_EXT.
-    flash_bank_0_data_region = 2;
-    // First 0x20 pages are configured by ROM_EXT. To avoid conflicts, skip over
-    // these pages.
-    flash_bank_1_page_index = flash_info.data_pages + 0x20;
-  }
-  flash_bank_1_data_region = flash_bank_0_data_region + 1;
-  flash_bank_1_data_region_scr = flash_bank_0_data_region + 2;
+  // First 0x20 pages are configured by ROM_EXT. To avoid conflicts, skip over
+  // these pages.
+  flash_bank_1_page_index = flash_info.data_pages + 0x20;
   flash_bank_1_page_index_scr = flash_info.data_pages * 2 - 1;
 
   CHECK_DIF_OK(dif_rv_plic_init(

sw/device/tests/flash_ctrl_write_clear_test.c

@@ -39,8 +39,7 @@ enum {
   // partition in bank 1, otherwise known as owner partition B.
   kBank1StartPageNum = 256 + kRomExtPageCount,
 
-  // The ROM_EXT protects itself using regions 0-1.
-  kFlashRegionNum = 2,
+  kDataRegions = FLASH_CTRL_PARAM_NUM_REGIONS,
 
 };
 
@@ -93,7 +92,6 @@ static void flash_ctrl_write_clear_test(
   const uint64_t kExpectedValues[] = {
       UINT64_MAX, UINT64_MAX - 1, 0, 0xa5a5a5a594949494, 0xaaaaaaaaaaaaaaaa,
   };
-
   for (size_t i = 0; i < ARRAYSIZE(kExpectedValues); ++i) {
     flash_word_write_verify(start_addr + sizeof(uint64_t) * i,
                             kExpectedValues[i]);
@@ -102,9 +100,16 @@ static void flash_ctrl_write_clear_test(
 }
 
 bool test_main(void) {
+  uint32_t flash_region_index;
+
   CHECK_DIF_OK(dif_flash_ctrl_init_state(
       &flash, mmio_region_from_addr(TOP_EARLGREY_FLASH_CTRL_CORE_BASE_ADDR)));
 
+  // Find the first unlocked flash region and use that for testing
+
+  CHECK_STATUS_OK(flash_ctrl_testutils_find_unlocked_region(
+      &flash, 0, kDataRegions - 1, &flash_region_index));
+
   // The ROM_EXT configures the default region access. We can't modify the
   // values after configured.
   if (kBootStage != kBootStageOwner) {
@@ -114,7 +119,7 @@ bool test_main(void) {
   }
 
   LOG_INFO("ECC enabled with high endurance disabled.");
-  flash_ctrl_write_clear_test(/*mp_region_index=*/kFlashRegionNum,
+  flash_ctrl_write_clear_test(/*mp_region_index=*/flash_region_index,
                               (dif_flash_ctrl_data_region_properties_t){
                                   .base = kBank1StartPageNum,
                                   .size = 1,
@@ -128,7 +133,7 @@ bool test_main(void) {
                                   }});
 
   LOG_INFO("ECC enabled with high endurance enabled.");
-  flash_ctrl_write_clear_test(/*mp_region_index=*/kFlashRegionNum,
+  flash_ctrl_write_clear_test(/*mp_region_index=*/flash_region_index,
                               (dif_flash_ctrl_data_region_properties_t){
                                   .base = kBank1StartPageNum + 1,
                                   .size = 1,

sw/device/tests/rv_core_ibex_mem_test.c

@@ -60,10 +60,10 @@ enum {
 
   kFlashTestLoc = TOP_EARLGREY_FLASH_CTRL_MEM_BASE_ADDR +
                   kBank1StartPageNum * kFlashBytesPerPage,
-  // The ROM_EXT protects itself using regions 0-1.
-  kFlashRegionNum = 2,
 };
 
+static uint32_t flash_region_index;
+
 // The flash test location is set to the encoding of `jalr x0, 0(x1)`
 // so execution can be tested.
 const uint32_t kFlashTestLocContent = 0x00008067;
@@ -164,10 +164,14 @@ static void setup_flash(void) {
   dif_flash_ctrl_data_region_properties_t data_region = {
       .base = kBank1StartPageNum, .size = 0x1, .properties = region_properties};
 
+  // Find the first unlocked flash region and use that for testing
+  CHECK_STATUS_OK(flash_ctrl_testutils_find_unlocked_region(
+      &flash_ctrl, 0, FLASH_CTRL_PARAM_NUM_REGIONS - 1, &flash_region_index));
+
   CHECK_DIF_OK(dif_flash_ctrl_set_data_region_properties(
-      &flash_ctrl, kFlashRegionNum, data_region));
+      &flash_ctrl, flash_region_index, data_region));
   CHECK_DIF_OK(dif_flash_ctrl_set_data_region_enablement(
-      &flash_ctrl, kFlashRegionNum, kDifToggleEnabled));
+      &flash_ctrl, flash_region_index, kDifToggleEnabled));
 
   // Make flash executable
   CHECK_DIF_OK(